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Transmission Electron Microscopy

Transmission electron microscopy, or TEM, is an extremely useful technique available to scientists in the observation of internal structures of samples.

We have two TEMs available for general use here at SUMC, a JEOL 200CX and a JEOL 3010. Our 200CX is the workhorse of the TEMs with an operating voltage of between 80 and 200 keV available, along with single-tilt, dual-tilt and heating holders available. The 3010 is a high resolution TEM capable of operating at up to 300 keV and has single-tilt, dual-tilt and heating holders available also. The 3010 is also fitted with PEELS and EDX systems for analysis.

In addition, we have recently constructed and are now operating a TEM with in situ ion irradiation. Built with EPSRC funding, this facility allows samples to be observed whilst they are being irradiated allowing the dynamic effects of radiation damage to be explored.

TEM with in situ ion irradiation

Please go to our TEM gallery page to see images obtained on our microscopes or explore any of our other facilities via the links on the left of this page.

If you wish to use any of our microscopes, or have one of our highly trained personnel look at a sample for you, please do not hesitate to contact us.